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Standards Worldwide
Standards Worldwide
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Standard [CURRENT]

NF C96-022-38:2008-06-01

NF EN 60749-38:2008-06-01

Semiconductor devices - Mechanical and climatic test methods - Part 38: soft error test method for semiconductor devices with memory

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 38: Soft-Error-Prüfverfahren für Halbleiterbauelemente mit Speicher
Publication date
2008-06-01
Original language
French
Pages
17

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Publication date
2008-06-01
Original language
French
Pages
17

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