Standard
[CURRENT]
NF C96-022-38:2008-06-01
NF EN 60749-38:2008-06-01
Semiconductor devices - Mechanical and climatic test methods - Part 38: soft error test method for semiconductor devices with memory
- German title
- Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 38: Soft-Error-Prüfverfahren für Halbleiterbauelemente mit Speicher
- Publication date
-
2008-06-01
- Original language
-
French
- Pages
- 17
- Publication date
-
2008-06-01
- Original language
-
French
- Pages
- 17
Product information on this site:
Quick delivery via download or delivery service
Buy securely with a credit card or pay upon receipt of invoice
All transactions are encrypted
Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...