Standard
[CURRENT]
NF C96-022-35:2006-12-01
NF EN 60749-35:2006-12-01
Semiconductor devices - Mechanical and climatic test methods - Part 35: acoustic microscopy for plastic encapsulated electronic components
- German title
- Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 35: Ultraschallmikroskopie für kunststoffverkappte Bauelemente der Elektronik
- Publication date
-
2006-12-01
- Original language
-
French
- Pages
- 22
- Publication date
-
2006-12-01
- Original language
-
French
- Pages
- 22
Product information on this site:
Quick delivery via download or delivery service
Buy securely with a credit card or pay upon receipt of invoice
All transactions are encrypted
Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...