Semiconductor devices - Mechanical and climatic test methods - Part 30: preconditioning of non-hermetic surface mount devices prior to reliability testing
German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 30: Behandlung nicht hermetisch verkappter oberflächenmontierbarer Bauelemente vor Zuverlässigkeitsprüfungen
Publication date
2020-09-25
Original language
French
Pages
19
Publication date
2020-09-25
Original language
French
Pages
19
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