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Standard [CURRENT]

NF C96-022-30:2020-09-25

NF EN IEC 60749-30:2020-09-25

Semiconductor devices - Mechanical and climatic test methods - Part 30: preconditioning of non-hermetic surface mount devices prior to reliability testing

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 30: Behandlung nicht hermetisch verkappter oberflächenmontierbarer Bauelemente vor Zuverlässigkeitsprüfungen
Publication date
2020-09-25
Original language
French
Pages
19

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Publication date
2020-09-25
Original language
French
Pages
19

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