Semiconductor devices - Mechanical and climatic test methods - Part 27: electrostatic discharge (ESD) sensivity testing - Machine model (MM)
German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 27: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Machine Model (MM)
Publication date
2006-12-01
Original language
French
Pages
15
Publication date
2006-12-01
Original language
French
Pages
15
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