Standard
[CURRENT]
NF C96-022-23:2004-07-01
NF EN 60749-23:2004-07-01
Semiconductor devices - Mechanical and climatic test methods - Part 23: high temperature operating life
- German title
- Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 23: lebensdauer bei hoher Temperatur
- Publication date
-
2004-07-01
- Original language
-
French
- Pages
- 11
- Publication date
-
2004-07-01
- Original language
-
French
- Pages
- 11
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