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Standard [CURRENT]

ISO 23830:2008-11

Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

German title
Chemische Analytik an Oberflächen - Sekundärionenmassenspektromtrie - Wiederholpräzision und Konstanz der relativen Intensitätsskala bei der statischen Sekundärionenmassenspektromtrie
Publication date
2008-11
Original language
English
Pages
12

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Publication date
2008-11
Original language
English
Pages
12

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Content
ICS
71.040.50

Cooperation at DIN

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