We use cookies to make our websites more user-friendly and to continuously improve them. If you continue to use the website, you consent to the use of cookies. You can find more information in our privacy statement and our cookie guidelines.

Standards Worldwide
Standards Worldwide
Phone +49 30 58885700-07

Standard [WITHDRAWN]

ISO 22493:2008-10

Microbeam analysis - Scanning electron microscopy - Vocabulary

German title
Mikrobereichsanalyse - Rasterelektronenmikroskopie - Vokabular
Publication date
2008-10
Original language
English
Pages
22

from 70.10 EUR VAT included

from 65.51 EUR VAT excluded

Format and language options

PDF download 1

  • 70.10 EUR

Shipment (3-5 working days) 1

  • 79.40 EUR

Monitor with the Standards Ticker

1

 Attention: Document withdrawn!

Easily subscribe: Save time and money now!

You can also subscribe to this document - together with other important standards in your industry. This makes your work easier and pays for itself after a short time.

Sparschwein_data
Subscription advantages
Sparschwein Vorteil 1_data

Important standards for your industry, regularly updated

Sparschwein Vorteil 2_data

Much cheaper than buying individually

Sparschwein Vorteil 3_data

Useful functions: Filters, version comparison and more

Publication date
2008-10
Original language
English
Pages
22

Product information on this site:

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Content
ICS
01.040.37, 37.020
Replacement amendments

This document has been replaced by: ISO 22493:2014-04 .

Cooperation at DIN

Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...