Surface chemical analysis - Secondary ion mass spectrometry - Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
German title
Chemische Oberflächenanalyse - Sekundärionenmassenspektroskopie - Korrekturverfahren für gesättigte Intensität bei Einzelionen zählender dynamischer Sekundärionenmassenspektroskopie
Publication date
2018-03
Original language
English
Pages
15
Publication date
2018-03
Original language
English
Pages
15
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Content
ICS
71.040.40
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