We use cookies to make our websites more user-friendly and to continuously improve them. If you continue to use the website, you consent to the use of cookies. You can find more information in our privacy statement and our cookie guidelines.

Standards Worldwide
Standards Worldwide
Phone +49 30 58885700-07

Standard [CURRENT]

ISO 17331 AMD 1:2010-07

Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy; Amendment 1

German title
Chemische Oberflächenanalyse - Chemische Methoden für die Sammlung von Elementen von der Oberfläche von Siliziumscheiben-Arbeits-Referenzmaterialien und deren Bestimmung mit Totalreflexions-Röntgenfluoreszenzanalyse (TXRF); Änderung 1
Publication date
2010-07
Original language
English
Pages
2

from 19.30 EUR VAT included

from 18.04 EUR VAT excluded

Format and language options

PDF download

  • 19.30 EUR

Shipment (3-5 working days)

  • 21.90 EUR

Monitor with the Standards Ticker

This option is only available after login.
Easily subscribe: Save time and money now!

You can also subscribe to this document - together with other important standards in your industry. This makes your work easier and pays for itself after a short time.

Sparschwein_data
Subscription advantages
Sparschwein Vorteil 1_data

Important standards for your industry, regularly updated

Sparschwein Vorteil 2_data

Much cheaper than buying individually

Sparschwein Vorteil 3_data

Useful functions: Filters, version comparison and more

Publication date
2010-07
Original language
English
Pages
2

Product information on this site:

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Cooperation at DIN

Loading recommended items...
Loading recommended items...
Loading recommended items...