Standards Worldwide
Standards Worldwide
Phone +49 30 58885700-07

Standard [CURRENT] Article is not orderable

IEC 62047-22:2014-06

Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates

German title
Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 22: Elektromechanisches Zug-Prüfverfahren für leitfähige Dünnschichten auf flexiblen Substraten
Publication date
2014-06
Original language
English, French
Pages
20
Publication date
2014-06
Original language
English, French
Pages
20

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...