Standard
[CURRENT]
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IEC 60749-38:2008-02
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
- German title
- Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 38: Soft-Error-Prüfverfahren für Halbleiterbauelemente mit Speicher
- Publication date
-
2008-02
- Original language
-
English,
French
- Pages
- 26
- Publication date
-
2008-02
- Original language
-
English,
French
- Pages
- 26
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