IEC 60749-31 Corrigendum 1:2003-08

Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

German title: Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 31: Entflammbarkeit von Bauelementen in Kunststoffgehäusen (Selbstentzündung)
Publication date: 2003-08
Original language: English, French

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