Standard
[CURRENT]
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IEC 60749-29:2011-04
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
- German title
- Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 29: Latch-up-Prüfung
- Publication date
-
2011-04
- Original language
-
English,
French
- Pages
- 48
- Publication date
-
2011-04
- Original language
-
English,
French
- Pages
- 48
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