IEC 60749-27 AMD 1:2012-09

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM); Amendment 1

German title: Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 27: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Machine Model (MM); Änderung 1
Publication date: 2012-09
Original language: English, French
Pages: 5

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