IEC 60749-23:2004-02

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

German title: Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 23: Lebensdauer bei hoher Temperatur
Publication date: 2004-02
Original language: English, French
Pages: 26

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Replacement amendments

This document has been modified by: IEC 60749-23 AMD 1:2011-01

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