Standard
[CURRENT]
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IEC 60749-23 Edition 1.1:2011-03
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
- German title
- Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 23: Lebensdauer bei hoher Temperatur
- Publication date
-
2011-03
- Original language
-
English,
French
- Pages
- 18
- Publication date
-
2011-03
- Original language
-
English,
French
- Pages
- 18
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