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IEC 60749-23 AMD 1:2011-01

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 23: Lebensdauer bei hoher Temperatur
Publication date
2011-01
Original language
English, French
Pages
5
Publication date
2011-01
Original language
English, French
Pages
5

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