IEC 60749-11 Corrigendum 1:2003-01

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method

German title: Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 11: Rascher Temperaturwechsel; Zweibäderverfahren
Publication date: 2003-01
Original language: English, French

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