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Standard [CURRENT]

EIA JESD 51-14:2010-11

Transient Dual Interface Test Method for the Measurement of the Thermal Resistance Junction to Case of Semiconductor Devices with Heat Flow Trough a Single Path

Publication date
2010-11
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  • This item will be ordered specially for you, therefore delivery may take 1 to 2 weeks.

Original language
English
Pages
46

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Publication date
2010-11
Information

  • This item will be ordered specially for you, therefore delivery may take 1 to 2 weeks.

Original language
English
Pages
46

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