Standards Worldwide
Standards Worldwide
Phone +49 30 58885700-07

Standard [CURRENT]

DIN EN 62810:2015-12

Cylindrical cavity method to measure the complex permittivity of low-loss dielectric rods (IEC 62810:2015); German version EN 62810:2015

German title
Zylindrisches Hohlraumverfahren zur Messung der komplexen Permittivität von verlustarmen dielektrischen Stäben (IEC 62810:2015); Deutsche Fassung EN 62810:2015
Publication date
2015-12
Original language
German
Pages
19

from 99.10 EUR VAT included

from 92.62 EUR VAT excluded

Format and language options

PDF download
  • 99.10 EUR

Shipment (3-5 working days)
  • 119.80 EUR

Monitor with the Standards Ticker

This option is only available after login.
Easily subscribe: Save time and money now!

You can also subscribe to this document - together with other important standards in your industry. This makes your work easier and pays for itself after a short time.

Sparschwein_data
Subscription advantages
Sparschwein Vorteil 1_data

Important standards for your industry, regularly updated

Sparschwein Vorteil 2_data

Much cheaper than buying individually

Sparschwein Vorteil 3_data

Useful functions: Filters, version comparison and more

Publication date
2015-12
Original language
German
Pages
19
DOI
https://dx.doi.org/10.31030/2352630

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Overview

With this measuring method the dielectric properties of low-loss materials in coaxial cables and electronic devices for use in microwave systems can be determined. It uses the TM010 mode in a circular cylindrical cavity and presents accurate measurement results of a dielectric rod sample, where the effect of sample insertion holes is taken into account accurately on the basis of the rigorous electromagnetic analysis. The committee responsible is DKE/UK 412.4 "Passive HF- und Mikrowellenbauelemente" ("RF and microwave passive components") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.

ICS
17.220.20
DOI
https://dx.doi.org/10.31030/2352630

Cooperation at DIN

Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...