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Standard [CURRENT]

DIN EN 62435-2:2017-10

VDE 0884-135-2:2017-10

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms (IEC 62435-2:2017); German version EN 62435-2:2017

German title
Elektronische Bauteile - Langzeitlagerung elektronischer Halbleiterbauelemente - Teil 2: Schädigungsmechanismen (IEC 62435-2:2017); Deutsche Fassung EN 62435-2:2017
Publication date
2017-10
Original language
German
Pages
23

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Publication date
2017-10
Original language
German
Pages
23

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Overview

The economic service life of an electronic component is very short compared to the service life of industrial equipment, the service life of power generation and distribution applications or in transportation. Due to the diverse application of electronics in all areas and the rapid technical development, the obsolescence of electronic components, especially integrated circuits, has become increasingly important in recent years. In most cases, the solution to an emerging obsolescence problem is to systematically store the components. The technical risks of this solution are largely low a priori. However, it requires perfect control of the implemented process and especially of the storage conditions, whereby this solution becomes critical when long-term storage occurs. Long-term storage presupposes that components are stored for a number of years in a storage facility that cannot be interrupted. It is essential that the components are usable after storage. Particular attention shall therefore be paid to the storage media that exist around the components, together with the local environmental conditions. The application of the procedure proposed in this series of standards in no way guarantees that the stored components will be in perfect working order at the end of storage. It is only a means of minimizing potential and probable degradation factors, in particular humidity, electrostatic fields, ultraviolet light, large temperature fluctuations, air pollution and outgassing. This series of standards is intended to provide practical guidance for long-term storage procedures for electronic components when there is intended or planned storage of the product for a number of years. This part of the series of standards DIN EN 62435 (VDE 0884-35) deals with the way in which components degrade over time depending on the storage conditions used. This part also provides guidance on the test methods that can be used to evaluate these damage mechanisms for certain types of components. The responsible committee is DKE/K 631 "Halbleiterbauelemente" ("Semiconductor devices") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.

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