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Standard [WITHDRAWN]

DIN EN 60749-43:2018-05

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans (IEC 60749-43:2017); German version EN 60749-43:2017

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 43: Leitfaden Pläne zur Zuverlässigkeitsqualifikation von integrierten Schaltungen (IEC 60749-43:2017); Deutsche Fassung EN 60749-43:2017
Publication date
2018-05
Original language
German
Pages
40

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Publication date
2018-05
Original language
German
Pages
40
DOI
https://dx.doi.org/10.31030/2809727

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ICS
31.080.01
DOI
https://dx.doi.org/10.31030/2809727
Replacement amendments

This document has been replaced by: DIN EN IEC 63287-1:2023-09 .

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