Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (IEC 60749-24:2004); German version EN 60749-24:2004
German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 24: Beschleunigte Verfahren für Feuchtebeständigkeit - Hochbeschleunigte Wirkung (HAST) ohne elektrische Beanspruchung (IEC 60749-24:2004); Deutsche Fassung EN 60749-24:2004
Publication date
2004-09
Original language
German
Pages
11
Publication date
2004-09
Original language
German
Pages
11
DOI
https://dx.doi.org/10.31030/9569083
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ICS
31.080.01
DOI
https://dx.doi.org/10.31030/9569083
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