DIN EN 55016-1-4:2011-03

This standard contains the German version of the 3. edition of the European Standard EN 55016-1-4 (2010 edition) and is identical to the 3. edition of the International Standard IEC/CISPR 16-1-4 (2010 edition). It specifies requirements for antennas and test sites intended for measurement of high-frequency radiated disturbances (interference field strengths) in the frequency range 9 kHz to 18 GHz. The EMC product committees and users of measurements of electromagnetic disturbances are recommended to observe the corresponding specifications of standard series IEC/CISPR 16 or EN 55016 for measuring equipment, measuring methods as well as measurement uncertainty for their specifications for measurement of high-frequency disturbances (radio disturbances). The required definitions are contained in this standard. Subsequently, it defines specifications for the different types of antennas for measuring electric, magnetic and electromagnetic fields and for test sites, including the verification method for the suitability of the test site. Free field test sites and alternative test sites (to these) are considered thereby. With respect to the previous standard, amendments in regards to the determination of the influences of the table for the test setup have been made, and this determination has been expanded to frequencies up to 18 GHz. The measurement of the influence is determined by comparing the results with and without the table. The investigations have demonstrated that a particular table material is noncritical, whereas the resulting influence of the table shall be considered when using other materials during preparation of the uncertainty budget. Furthermore, the title of the standard has been more suitably adapted to its scope. The responsible Committee is Subcommittee UK 767.4 "Geräte und Verfahren zur Messung von elektromagnetischen Aussendungen" ("Apparatus and methods for measurement of electromagnetic emissions") of the DKE (German Commission for Electrical, Electronic and Informational Technologies) at DIN and VDE.