Standard
[CURRENT]
BS IEC 62047-32:2019-01-29
Semiconductor devices. Micro-electromechanical devices. Test method for the nonlinear vibration of MEMS resonators
- Publication date
-
2019-01-29
- Original language
-
English
- Pages
- 22
- Publication date
-
2019-01-29
- Original language
-
English
- Pages
- 22
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