Standard
[CURRENT]
BS EN IEC 63364-1:2023-02-02
Semiconductor devices. Semiconductor devices for IoT system. Test method of sound variation detection
- German title
- Halbleiterbauelemente. Halbleiterbauelemente für IOT-Systeme Prüfverfahren für die Erkennung von Schallschwankungen
- Publication date
-
2023-02-02
- Original language
-
English
- Pages
- 18
- Publication date
-
2023-02-02
- Original language
-
English
- Pages
- 18
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