Standard
[CURRENT]
BS EN 62374-1:2010-12-31
Semiconductor devices. Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
- German title
- Halbleiterbauelemente. Prüfung auf zeitabhängigen dielektrischen Durchbruch (TDDB) bei Isolationsschichten zwischen metallischen Leiterbahnen
- Publication date
-
2010-12-31
- Original language
-
English
- Pages
- 20
- Publication date
-
2010-12-31
- Original language
-
English
- Pages
- 20
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