Standard
[CURRENT]
BS EN 62047-2:2006-11-30
Semiconductor devices - Micro-electromechanical devices - Tensile testing method of thin film materials
- German title
- Halbleiterbauelemente - Bauteile der Mikrosystemtechnik - Pruefverfahren zur Zugbeanspruchung bei Duennschicht-Werkstoffen
- Publication date
-
2006-11-30
- Original language
-
English
- Pages
- 16
- Publication date
-
2006-11-30
- Original language
-
English
- Pages
- 16
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