Standard
[CURRENT]
BS EN 60749-40:2011-09-30
Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using a strain gauge
- German title
- Halbleiterbauelemente. Mechanische und klimatische Prüfverfahren. Prüfverfahren zum Fall einer Leiterplatte unter Verwendung von Dehnungsmessstreifen
- Publication date
-
2011-09-30
- Original language
-
English
- Pages
- 26
- Publication date
-
2011-09-30
- Original language
-
English
- Pages
- 26
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