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Standard [CURRENT]

BS EN 60749-38:2008-06-30

Semiconductor devices - Mechanical and climatic test methods - Soft error test method for semiconductor devices with memory

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Soft-Error-Prüfverfahren für Halbleiterbauelemente mit Speicher
Publication date
2008-06-30
Original language
English
Pages
16

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Publication date
2008-06-30
Original language
English
Pages
16

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