Standard
[CURRENT]
BS EN 60749-23+A1:2004-06-24
Semiconductor devices. Mechanical and climatic test methods. High temperature operating life
- German title
- Halbleiterbauelemente. Mechanische und klimatische Prüfverfahren. Lebensdauer bei hoher Temperatur
- Publication date
-
2004-06-24
- Original language
-
English
- Pages
- 12
- Publication date
-
2004-06-24
- Original language
-
English
- Pages
- 12
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