Standard
[CURRENT]
BS EN 60749-14:2003-12-15
Semiconductor devices - Mechanical and climatic test methods - Robustness of terminations (lead integrity)
- German title
- Halbleiterbauelemente - Mechanische und klimatische Pruefverfahren - Festigkeit der Bauelementeanschluesse (Unversehrtheit der Anschluesse)
- Publication date
-
2003-12-15
- Original language
-
English
- Pages
- 18
- Publication date
-
2003-12-15
- Original language
-
English
- Pages
- 18
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