ASTM F 1263:2011

Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

German title: Richtlinie für die Analyse und Überprüfungsdaten bei der Strahlungsprüfung von Elektronikbauteilen
Publication date: 2011 reapproved: 2019
Original language: English
Pages: 3

Publication date: 2011 reapproved: 2019
Original language: English
Pages: 3
DOI: https://dx.doi.org/10.1520/F1263-11R19

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Short description

1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress level higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary, although exact knowledge may be replaced by over-conservative estimates of this distribution.

ICS

31.020

DOI

https://dx.doi.org/10.1520/F1263-11R19

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