ASTM E 766:2014

Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

German title: Eichung der Vergrößerung von REM (Rasterelektronenmikroskopen) unter Verwendung der Eichprobe NBS-SRM-484
Publication date: 2014 reapproved: 2019
Original language: English
Pages: 6

from 73.80 EUR VAT included

from 68.97 EUR VAT excluded

Format and language options

PDF download

Language: English
73.80 EUR
Redline incl. Original: English
88.60 EUR

Shipment (3-5 working days)

Language: English
82.10 EUR

Monitor with the Standards Ticker

This option is only available after login.

Publication date: 2014 reapproved: 2019
Original language: English
Pages: 6
DOI: https://dx.doi.org/10.1520/E0766-14R19

Product information on this site:

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Short description

1.1 This practice covers general procedures necessary for the calibration of magnification of scanning electron microscopes. The relationship between true magnification and indicated magnification is a complicated function of operating conditions. 2 Therefore, this practice must be applied to each set of standard operating conditions to be used. 1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ICS

37.020

DOI

https://dx.doi.org/10.1520/E0766-14R19

Loading recommended items...