ASTM E 431:1996

Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices

German title: Leitfaden über die Auswertung von Durchstrahlungsbildern von Halbleitern und ähnlichen Bauelementen
Publication date: 1996 reapproved: 2022
Original language: English
Pages: 7

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Publication date: 1996 reapproved: 2022
Original language: English
Pages: 7
DOI: https://dx.doi.org/10.1520/E0431-96R22

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Short description

1.1 This guide provides illustrations of radiographs of semiconductors and related devices. Low powered transistors (through the TO-11 case configuration), diodes, low-power rectifiers, power devices, and integrated circuits are illustrated with common assembly features. Particular areas of construction are featured for these devices detailing critical points of design or assembly. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ICS

31.080.01

DOI

https://dx.doi.org/10.1520/E0431-96R22

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