ASTM D 8544:2024

1.1 This test method covers the basic operation of the conductive deposit test. The apparatus is utilized to monitor the formation of dendrites and deposits that are conductive and may form under oxidation conditions of fluids used in electric vehicles and other industries where electronics are involved. The oxidation conditions can vary from 80 °C to 180 °C with very specific circuit boards, under power, and monitoring changes in conductance over time. Both the liquid and vapor areas are monitored for this condition over time. Variables in temperature, voltage, and time can be altered according to the industry need. A reported index based on the rate of deposit formation may be implemented. The typical testing is performed at 150 °C over a period of up to 500 h with a monitored voltage applied. Note 1: Testing up to 1000 h has some historical significance and is an option but not covered in this test method. 1.2 This test method has an interim precision. An interlaboratory study of this test method is being conducted and a complete precision statement is expected to be available on or before December 2024. 1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. 1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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