Standard Test Method for The Analysis of Boron and Silicon in Uranium Hexfluoride via Fourier-Transform Infrared (FTIR) Spectroscopy
Publication date
2016
Original language
English
Pages
7
Publication date
2016
Original language
English
Pages
7
DOI
https://dx.doi.org/10.1520/C1842-16
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Short description
1.1 This test method is suitable for determining boron and silicon impurities as BF 3 and SiF 4 in uranium hexafluoride. This test method is an alternative to those described in Test Methods C761 and C1771 . 1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.