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Standard [CURRENT]

ASTM B 499:2009

Standard Test Method for Measurement of Coating Thicknesses by the Magnetic Method: Nonmagnetic Coatings on Magnetic Basis Metals

German title
Schichtdickenmessung an nichtmagnetischen Überzügen auf magnetischen Werkstoffen mit dem magnetischen Verfahren
Publication date
2009 reapproved: 2021
Original language
English
Pages
5

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Publication date
2009 reapproved: 2021
Original language
English
Pages
5
DOI
https://dx.doi.org/10.1520/B0499-09R21E01

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Short description
1.1 This test method covers the use of magnetic instruments for the nondestructive measurement of the thickness of nonmagnetic coatings over ferrous or other magnetic base metals. It is intended to supplement manufacturers' instructions for the operation of the instruments and is not intended to replace them. Note 1 -Autocatalytically deposited nickel-phosphorus alloys containing more than 8 % phosphorus are sufficiently nonmagnetic to be measured by this test method, as long as the measurement is made prior to any heat treatment. 1.2 These instruments measure either the magnetic attraction between a magnet and the basis metal, as influenced by the presence of the coating (categorized as "magnetic pull-off"), or the change in magnetic-flux density within the probe (categorized as "electronic"). These instruments cannot distinguish the thickness of individual layers. They can only measure the cumulative thickness of all layers beneath the probe down to the base metal. 1.3 Measurements made in accordance with this test method will be in compliance with the requirements of ISO International Standard 2178 as printed in 1982. 1.4 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only. 1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
ICS
17.040.20
DOI
https://dx.doi.org/10.1520/B0499-09R21E01
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