Standard
[CURRENT]
ABNT NBR IEC 60749-29:2011-03-02
Semiconductor devices - Mechanical and climatic test methods Part 29: Latch-up test
- Publication date
-
2011-03-02
- Original language
-
Portuguese
- Pages
- 23
- Publication date
-
2011-03-02
- Original language
-
Portuguese
- Pages
- 23
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