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Standards Worldwide
Standards Worldwide
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Draft standard

OVE EN IEC 60749-5:2022-10-15 - Draft

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 47/2770/CDV) (english version)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung (IEC 47/2770/CDV) (englische Fassung)
Publication date
2022-10-15
Original language
English
Pages
12

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Publication date
2022-10-15
Original language
English
Pages
12

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