Standards Worldwide
Standards Worldwide
Phone +49 30 58885700-07

Draft standard

OEVE/OENORM EN 62951-1:2016-01-15 - Draft

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates (IEC 47/2256/CDV) (english version)

Publication date
2016-01-15
Original language
English
Pages
16

Please select

from 23.03 EUR VAT included

from 21.52 EUR VAT excluded

Purchasing options

PDF download
  • 23.03 EUR

Shipment (3-5 working days)
  • 25.88 EUR

Standards Ticker 1
1

Learn more about the standards ticker

Publication date
2016-01-15
Original language
English
Pages
16

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...