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Draft standard

OEVE/OENORM EN 60749-28:2004-05-01 - Draft

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) (IEC 47/1751/CDV)

Publication date
2004-05-01
Original language
English
Pages
20

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Publication date
2004-05-01
Original language
English
Pages
20

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