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Draft standard [WITHDRAWN]

DIN EN IEC 60749-5:2024-04 - Draft

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 47/2770/CDV:2022); German and English version prEN IEC 60749-5:2022

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung (IEC 47/2770/CDV:2022); Deutsche und Englische Fassung prEN IEC 60749-5:2022
Date of issue
2024-03-08
Publication date
2024-04
Original language
German, English
Pages
17

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Date of issue
2024-03-08
Publication date
2024-04
Original language
German, English
Pages
17
DOI
https://dx.doi.org/10.31030/3523462

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ICS
31.080.01
DOI
https://dx.doi.org/10.31030/3523462
Replacement amendments

This document has been replaced by: DIN EN IEC 60749-5:2024-09; VDE 0884-749-5:2024-09 .

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