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Draft standard

22/30383603 DC:2022-12-15 - Draft

BS IEC 63215-4. Endurance test methods for die attach materials applied to power electronic devices. Part 4. Power cycling test method for die attach materials (near chip interconnection) applied to module type power electronic devices

Publication date
2022-12-15
Original language
English
Pages
21

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Publication date
2022-12-15
Original language
English
Pages
21

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