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Draft standard

18/30375624 DC:2018-07-13 - Draft

BS EN 60749-20-1. Semiconductor devices. Mechanical and climatic test methods. Part 20-1. Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat

Publication date
2018-07-13
Original language
English
Pages
39

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Publication date
2018-07-13
Original language
English
Pages
39

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