DIN EN 60115-8-1:2016-03

This part of IEC 60115-8-1:2014 is applicable to the drafting of detail specifications for fixed surface mount (SMD) low-power film resistors in rectangular chip shape (styles RR) or in cylindrical MELF shape (styles RC) classified to level G, which is defined in IEC 60115-8:2009, 1.5 for general electronic equipment, typically operated under benign or moderate environmental conditions, where the major requirement is function. Examples for level G include consumer products and telecommunication user terminals. A detail specification form is a supplementary document to the sectional specification and contains provisions on the structure, arrangement and minimum content of detail specifications. Detail specifications which do not comply with these provisions are not to be classified as detail specifications according to CENELEC standards and shall not be designated as such. The detail specification prepared in accordance with this detail specification form defines the characteristic and rated values of fixed surface mount (SMD) resistors. These are assigned to classification level G, for electronic equipment for general use, usually under benign or moderate environmental conditions. Level G includes, for example, consumer products and telecommunications terminals. The document specifies test plans and requirements for quality assessment of the resistors it covers according to the specified quality assessment procedures. All resistors covered by this specification shall be subjected to 100% testing during the manufacturing process. The following tests shall be performed: Resistance value and limit deviation from the rated value of the resistor shall be measured during the manufacturing process and all non-conforming parts shall be discarded. This test shall be followed by re-testing by sampling to monitor the average outgoing quality to be specified in non-conforming parts per million (10^-6). The sampling level shall be determined by the manufacturer. The statistically validated quality limit shall be calculated by summing the test data. All non-conforming parts shall be considered for calculation of the quality level. If one or more non-conforming parts occur in a sample, that lot shall be rejected. In various clauses the design specification deals in detail with, among other things, terms, characteristics and design values, tests and test severities, test requirements, marking, packaging and ordering information, and quality assessment procedures. Normative Annex A deals with 0-ohm resistors (jumpers). Annex A applies only when 0-ohm resistors are part of the product scope covered by the design specification and when these 0-ohm resistors are to be subjected to the same quality assessment procedure. Informative Annex B contains formula symbols and abbreviations, Normative Annex ZA normative references to international publications with their corresponding European publications. The responsible committee is DKE/GK 613 "Widerstände" ("Resistors") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.