Standard [CURRENT]
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The Detail Specification describes fixed low power film resistors, they are metal film resistors on high grade ceramics, conformal coated or molded, and axial or preformed leads. The assessment level EZ, version A with 100-% test, version E with failure rate level and 100 %-test and stability classes 0,05; 0,1; 0,25; 0,5; 1; 2. This Specification meets the requirements for the zero-defect approach. The new assessment level EZ has been introduced to adapt the assessment procedures and levels to the given industrial practices. For this reason the agreed number of the allowed defective parts (acceptance number) used in test schedules with fixed sample sizes and in quality conformance inspection test schedules, together with the AQL values in test schedules for lot-by-lot tests by which the acceptance number "0" is replaced and the sample size for lot-by-lot tests is determined by allocating the codes selected from Table I of IEC 60410:1973 for the sample size directly to Table II. All resistors in accordance with this Specification shall be subjected to a 100 %-test. The following tests shall be carried out. The following modifications have been introduced with regard to DIN EN 140101-806:2008-08: - in 1.9.4, there are modifications with regard to the failure rate, resistance value and ordering designation used for electronic order processing. - in 2.1.22, NSI is replaced by IECQ certification body. In 2.3.2, NSI is replaced by IECQ certification body and NSI by IECQ CB. - In Clause B.2, IECQ CB - IECQ certification body and several notes are incorporated. Furthermore, P is replaced by p, the RKMG designation system has been introduced and explained by other notes. The responsible committee is DKE/GK 613 "Widerstände" ("Resistors") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.
This document replaces DIN EN 140101-806 Berichtigung 1:2010-01 , DIN EN 140101-806:2008-08 .